Diagnostics and Testing

B232 - Summer 23/24
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Diagnostics and Testing - BE3M38DIT

Credits 7
Semesters Summer
Completion Assessment + Examination
Language of teaching English
Extent of teaching 3P+2L
Annotation
The course introduces the fundamentals of the fault-detection, fault tolerance, machine condition monitoring, vibrations based diagnostics, non-destructive testing and testing of analog and digital circuits.
Course outlines
1. Diagnostics, prognostics, life cycle
2. Fault modelling, signal/model based fault detection
3. Reliability
4. Fault tolerance, static/dynamic/analytical redundancy, FMEA, FMECA
5. Performance evaluation of diagnostic methods (POD)
6. Diagnostic signal sources and analysis, preprocessing
7. Envelope, cepstral, order analysis, analysis of non-stationary signal
8. Diagnostics of mechanical, electrical and electromechanical systems
9. Diagnostics based on impulse and continuous acoustic emission
10. Non-destructive Testing (NDT), Detection and Localization
11. Ultrasonic NDT, Eddy Current NDT, active thermography
12. Testing of analog and digital circuits, production testing
13. In-circuit Testing, Built-in Self Test, Design for Test
14. Test generation, fault masking, test compression, boundary scan
Exercises outlines
1. Introduction to Diagnostics, Course Information, Schedule, Lab Practice and Electrical Safety
2. Laboratory Experiment:Fault detection using thermography
3. Laboratory Experiment: Vibrodiagnostics of shaft/gearbox
4. Laboratory Experiment: Eddy Current Non-destructive Testing
5. Laboratory Experiment: Ultrasonic Non-destructive Testing
6. Quiz, Assignment of Individual Project
7. Individual Project
8. Individual Project
9. Individual Project
10. Individual Project
11. Individual Project
12. Individual Project
13. Individual Project
14. Presentation of Individual Project, Assessment
Literature
[1] R. Isermann: Fault-Diagnosis Systems, Springer Verlag, 2006.
Optional:
[2] Ch. Hellier: Handbook of Nondestructive Evaluation, McGraw-Hill 2012.
[3] M. L. Bushnell, V.D. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, Boston, 2005.