CTU FEE Moodle
Special Methods of Devices Quality Evaluation
B232 - Summer 23/24
Special Methods of Devices Quality Evaluation - XP13SSD
| Credits | 4 |
| Semesters | Winter |
| Completion | Assessment + Examination |
| Language of teaching | Czech |
| Extent of teaching | 2P+2L |
Annotation
The evaluation of the principal values determining the quality of the passive and active devices. Measuring methods, their evaluation , identification of systematic faults. The description of the tested device, two ports parameters of the device. Matching of the device to the measuring circuit. The noise of the electronic circuits, optimal noise and power matching. Non-linearity of the "linear" circuits, intermodulation distortion, measuring of the non-linearity and intermodulations.
Study targets
A student are well-educated of the principal methods of evaluating of the quality of the passive and active devices
Course outlines
1.Measuring methods, their evaluation , identification of systematic faults.
2. The description of the tested device, two ports parameters of the device.
3. Matching of the device to the measuring circuit.
4. The noise of the electronic circuits,
5. Optimal noise and power matching.
6. Non-linearity of the "linear" circuits,
7. Intermodulation distortion,
8. Measuring of the non-linearity and intermodulations.
2. The description of the tested device, two ports parameters of the device.
3. Matching of the device to the measuring circuit.
4. The noise of the electronic circuits,
5. Optimal noise and power matching.
6. Non-linearity of the "linear" circuits,
7. Intermodulation distortion,
8. Measuring of the non-linearity and intermodulations.
Exercises outlines
1.Safety in laboratories. Instruction about lab. measurements - group 1.
2.Nonlinearity and noise of resistors.
3.Matched power amplifier
4.HF matching circuits.
5.Nose figure measurement
6.Matching in noise figure measuring circuits.
7.Evaluation of lab. reports.
8.Instruction about lab. measurements - group 2.
9.Intermodulating distortion measurement.
10.Measurement of non-linearity of linear devices.
11.Transformers and filters with distributed parameters.
12.Active two-ports, scattering parameters.
13.The stability of measuring circuits.
14.Evaluation of lab. reports. A credit.
2.Nonlinearity and noise of resistors.
3.Matched power amplifier
4.HF matching circuits.
5.Nose figure measurement
6.Matching in noise figure measuring circuits.
7.Evaluation of lab. reports.
8.Instruction about lab. measurements - group 2.
9.Intermodulating distortion measurement.
10.Measurement of non-linearity of linear devices.
11.Transformers and filters with distributed parameters.
12.Active two-ports, scattering parameters.
13.The stability of measuring circuits.
14.Evaluation of lab. reports. A credit.
Literature
[1] Detlefsen, J. ; Siart, U.: Grundlagen der Hochfrequenztechnik. München: Oldenbourg, 2012
[2] Zinke, Brunswig, Lehrbuch der Hochfrequenztechnik, 3. Auflage, Springer-Verlag, Berlin 1986
[2] Zinke, Brunswig, Lehrbuch der Hochfrequenztechnik, 3. Auflage, Springer-Verlag, Berlin 1986
Requirements
The credit reguirements: seminar presentation, one protokol of labs and the student must obtain minimally 50 % of avaliable points in the tests.